Description:
1. Technology Overview
The invention focuses on a device for measuring orbital states of electrons, specifically their orbital angular momentum (OAM). This device uses spatially varying electric fields around needle electrodes to measure the quantized angular momentum of charged particles. The technology is currently in the development stage, with promising cross-industry applications in electron microscopy, spectroscopy, and laboratory systems.
2. Key Features and Benefits
3. Applications and Market Focus
4. Commercial Advantages
5. Partnership Opportunities